EXPLORATORY DEVELOPMENT OF THE Q-FACTOR TECHNIQUE. SECTION 1 - RESULTS AND DISCUSSION OF FIRST NEUTRON TEST.

Abstract

This report presents damage constant comparisons for 2N1613 transistors irradiated both passively and in several operating conditions in a neutron environment of 7 x 10 to the 13th power n/sq cm, E > 0.1 Mev. Comparisons of damage are also made for three different temperatures during irradiation and three different measurement temperatures to determine the influence of each temperature condition. The damage constant behavior for 2N709, 2N914 and 2N1613 transistors was investigated at different levels of measurement current, from 0.00001 a to 0.1 a. (Author)

Document Details

Document Type
Technical Report
Publication Date
Dec 15, 1964
Accession Number
AD0609396

Entities

People

  • Max Frank

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Environment
  • Measurement
  • Q Factor
  • Transistors

Fields of Study

  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Semiconductor Device Technology
  • Thermal Physics or Thermal Science.