X-RAY SCATTERING BY POINT-DEFECTS.

Abstract

A device is described which was designed to detect the diffuse X-ray scattering caused by point defects in a crystal. Tests concerning the sensitivity of the apparatus are summarized, as are results of its application to problems involving the degree of order in diffuse solid solutions and the effects of irradiation on crystals.

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1962
Accession Number
AD0610006

Entities

People

  • A. Guinier
  • A. M. Levelut

Organizations

  • University of Paris

Tags

DTIC Thesaurus Topics

  • Crystals
  • Electromagnetic Scattering
  • Point Defects
  • Scattering
  • Sensitivity
  • Solid Solutions
  • Wave Phenomena
  • X Ray Scattering
  • X Rays

Fields of Study

  • Physics

Readers

  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Materials Science and Engineering.
  • Nuclear and Radiation Engineering.