DESIGN AND DEVELOPMENT OF SEMICONDUCTOR TEST SET, AN/USM-171.

Abstract

This quarter represented an intensive development and test phase which concentrated on the emitter finder stop-test circuit and fault circuits for the Semiconductor Test Set AN/USM-171. Verification of in-circuit leakage measurement and lead finding capabilities were achieved. Mechanical packaging of the basic structure was accomplished. (Author)

Document Details

Document Type
Technical Report
Publication Date
Sep 30, 1964
Accession Number
AD0610739

Entities

People

  • P. M. Kurland
  • T. B. Stavely
  • T. J. Ryan
  • W. R. Orloff

Tags

DTIC Thesaurus Topics

  • Carbides
  • Chemical Compounds
  • Compound Semiconductors
  • Electronics
  • Inorganic Carbon Compounds
  • Inorganic Chemicals
  • Measurement
  • Packaging
  • Semiconductors
  • Solid State Electronics
  • Test Sets
  • Verification

Fields of Study

  • Engineering

Readers

  • Aerospace Test and Evaluation
  • Integrated Circuit Design and Technology.
  • Technical Research and Report Writing.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems