RELIABILITY ANALYSIS OF NON-ELECTRONIC COMPONENTS USING WEIBULL, GAMMA, AND LOG NORMAL DISTRIBUTIONS.
Abstract
Reliability analysis using the Weibull, log normal, and gamma distributions for non-electronic components is complicated by non-standardization, small lot sizes, and the interaction between components. The Weibull distribution is useful in the failure analysis of structures, ball bearings, brittle beams, and spin gyros. The log normal distribution is used in the failure analysis of aircraft structures and helicopter blades, while the gamma distribution is useful in failure analysis of aluminum strips. It can also be shown that data for a particular example may be fitted to one or more of the distributions with equal success. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1964
- Accession Number
- AD0610774
Entities
People
- Dutton G. Stoy
Organizations
- Air Force Institute of Technology