ELECTRON TIME OF FLIGHT SPECTROMETER.
Abstract
The work to date has shown that the principle of velocity selection by time-of-flight measurement is applicable to slow electrons. Energies below 0.25 volt have been detected, and there seems to be hope that this can be extended downward by at least a factor of 5. The present limits are set by practical problems of shielding, light source duration, interactions of the sample gas with emitter and detector surfaces and contact emf changes. The accuracy of measuring cross sections will be limited mainly by the pressure measurement technique and the interactions of the sample gases with surfaces in the spectrometer. This spectrometer can be adapted with relatively minor changes to studies of electron reflection, of secondary emission, photoelectric spectra, adsorbed films, and surface states of solids.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 28, 1964
- Accession Number
- AD0611128
Entities
People
- G. C. Baldwin
Organizations
- General Electric