PROCEDURES FOR PRECISE DETERMINATION OF THERMAL RADIATION PROPERTIES.
Abstract
The preliminary design of an integrating-sphere reflectometer, utilizing a helium-neon continuous-wave gas laser as the source, for measuring the reflectance of specimens at high temperature, was completed. Development work on an ellipsoidal mirror reflectometer for measuring spectral reflectance in the wavelength range of 2 to 15 microns of specimens at room temperature was continued. The study of equations relating spectral emissivity of metals to other properties was continued. Platinum-13% rhodium and oxidized Inconel working standards of normal spectral emittance were calibrated over the wavelength range of 1 to 15 microns at temperatures of 800, 1100 and 1300 degrees K. Several modifications of the normal spectral emittance equipment were made to permit operation in the 15-35 micron range. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1965
- Accession Number
- AD0612812
Entities
People
- D. P. Dewitt
- J. C. Richmond
- W. D. Hayes Jr.
Organizations
- National Institute of Standards and Technology