MEASUREMENT OF THE ION FLUX EMANATING FROM OXIDE COATED EMISSION FILAMENTS IN A SIEMENS ELECTRON MICROSCOPE,

Abstract

A Faraday cage, inserted into a Siemens Elmiskop I and used in conjunction with in-microscope radiation damage experiments, is described. It is positioned and the microscope is operated so that it can discriminate and hence separately measure either the oxygen ion or the electron flux simultaneously emitted from oxide-coated filaments. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jul 24, 1964
Accession Number
AD0612993

Entities

People

  • J. R. Parsons
  • L. M. Howe

Tags

DTIC Thesaurus Topics

  • Corpuscular Radiation
  • Electron Flux
  • Electron Microscopes
  • Electrons
  • Elementary Fermions
  • Elementary Particles
  • Emission
  • Fermions
  • Filaments
  • Ionizing Radiation
  • Measurement
  • Microscopes
  • Nuclear Radiation
  • Radiation
  • Subatomic Particles

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Plasma Physics.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene