HIGH SPEED SEMICONDUCTOR SWITCH (TWO TERMINAL) AND HIGH SPEED SEMICONDUCTOR SWITCH (GATE).

Abstract

Results obtained from studies of the failure mode of the two-terminal device as well as processing techniques including die-cutting, surface cleanup and preservation and assembly methods are discussed. Test equipment design and test results for the engineering samples submitted during the quarter are included. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 28, 1964
Accession Number
AD0613275

Entities

People

  • B. G. Burlingame
  • W. F. Munzer

Organizations

  • Motorola Mobility

Tags

DTIC Thesaurus Topics

  • Assembly
  • Compound Semiconductors
  • Electronic Equipment
  • Electronics
  • Engineering
  • Failure Mode And Effect Analysis
  • Semiconductors
  • Solid State Electronics
  • Terminals
  • Test Equipment

Readers

  • Electrical Engineering
  • Software Engineering

Technology Areas

  • Microelectronics