X-RAY DIFFRACTION STUDIES OF THERMAL MOTIONS IN CRYSTALS.
Abstract
The principal technical effort was directed to the experimental difficulties associated with the measurement of integrated intensity from near perfect crystals. Although results continued to substantiate ideas about the temperature dependence of the integrated intensity, the reproducibility of those results was not satisfactory. The most probable causes of the difficulty seemed to be: (1) Variation of perfection from place to place on the crystal. In this case a small shift in the x-ray beam position would change the integrated intensity and, hence, an apparently different temperature dependence. (2) Crystal strain induced either thermally or by the mounting adhesive. (3) Temperature fluctuations around the apparatus. Instrument changes sufficient to affect the sensitive measurements could thereby be caused. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 25, 1965
- Accession Number
- AD0613578
Entities
People
- R. A. Young
Organizations
- Georgia Tech