INFLUENCE OF A FINELY DISPERSED SECOND PHASE ON RECRYSTALLIZATION,

Abstract

The annealing behavior of internally oxidized alloys of silver containing magnesium and copper containing aluminum was studied by transmission electron microscopy. In agreement with observations on pure materials, annealing of the dispersion-hardened alloys involves the formation of subgrains from the cell structure and the subsequent growth of the subgrains into the matrix. The kinetics of both subgrain formation and growth are extremely slow in the dispersion-containing alloys, compared to pure silver and copper. This retardation could be attributed to the nature of the deformed structure, which does not contain regions of severe plastic curvature. As a result, the formation of mobile interfaces by misorientation accumulation is difficult. Particle interaction with dislocation motion during subgrain formation and direct particle interaction with the migrating subgrain boundaries during growth are discussed. (Author)

Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1965
Accession Number
AD0613971

Entities

People

  • John L. Brimhall
  • Mark J. Klein
  • Robert A. Huggins

Organizations

  • Stanford University

Tags

DTIC Thesaurus Topics

  • Agreements
  • Aluminum
  • Annealing
  • Boundaries
  • Cell Structure
  • Cells
  • Curvature
  • Dislocations
  • Dispersions
  • Electron Microscopy
  • Electrons
  • Geometry
  • Kinetics
  • Magnesium
  • Microscopy
  • Particles
  • Transmission Electron Microscopy

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Powder metallurgy of Titanium alloys.

Technology Areas

  • Microelectronics