PROCEEDINGS OF THE ANNUAL JOINT MILITARYINDUSTRIAL ELECTRONIC TEST EQUIPMENT SYMPOSIUM (4TH), HELD AT THE MUSEUM OF SCIENCE AND INDUSTRY, CHICAGO, ILLINOIS SEPTEMBER 14 AND 15, 1960,

Abstract

The symposium was presented to emphasize the advanced instrumentation techniques currently being developed to keep pace with expanding system requirements. The technical sessions were planned to be sufficiently diversified, both at the practical and more technical levels, in order to stimulate the exchange of information among the individuals present. Industrial and government representatives attended a total of seventeen technical presentations in addition to a luncheon address. The technical sessions presented such general topics as voltage and power measurements, microwave measurement techniques, systems measurements, and fault analysis. Specific papers provided technical data on a variety of instruments, measurement techniques, and analytical approaches to measurement problems.

Document Details

Document Type
Technical Report
Publication Date
Sep 15, 1960
Accession Number
AD0614589

Entities

Organizations

  • IIT Research Institute

Tags

DTIC Thesaurus Topics

  • Engineering
  • Governments
  • Illinois
  • Instrumentation
  • Measurement
  • Measuring Instruments
  • Microwaves
  • Power Measurement
  • Test Equipment

Readers

  • Academic Conference Management
  • Instructional Design and Training Evaluation.

Technology Areas

  • Microelectronics