NOTES ON THE USE OF SEMICONDUCTOR STRAIN GAGES,

Abstract

The properties, advantages, and limitations of semiconducting strain gages as measurement tools are reviewed from the user's point of view. Conventional and semiconductor gages are compared. Compensation techniques for nonlinearity and for temperature effects are described. (Author)

Document Details

Document Type
Technical Report
Publication Date
Apr 30, 1965
Accession Number
AD0615802

Entities

People

  • Harry J. Davis
  • Leon Horn

Organizations

  • Harry Diamond Laboratories

Tags

DTIC Thesaurus Topics

  • Carbides
  • Chemical Compounds
  • Compensation
  • Compound Semiconductors
  • Electronics
  • Gages
  • Inorganic Carbon Compounds
  • Inorganic Chemicals
  • Measurement
  • Measuring Instruments
  • Semiconductors
  • Solid State Electronics
  • Strain Gages

Readers

  • Materials Science (Mechanical Engineering).
  • Materials Science and Engineering.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene