INVESTIGATION OF BONDING IN OXIDE-FIBER (WHISKER) REINFORCED METALS.
Abstract
The character of wetting and bonding between single crystal sapphire (alpha-Al2O3) and sessile drops of nickel doped with 1 atomic percent of chromium, titanium or zirconium was studied. Bonding in these systems was found to proceed in the following manner: (a) segregation of the active metal, (b) concentration of the active metal at the interface, (c) reaction of active metal with the sapphire substrate, (d) formation of new crystalling phases at the interface, with (e) diffusion of the active metal into the sapphire. Detailed investigations of metal/sapphire interfaces were conducted using the methods of x-ray diffraction optical and electron microscopy and microhardness. An hypothesis for the mode of bond failure relating to the nature of the underlying sapphire surface is presented. Differences between true interfacial bonding and 'engineering bonding' were noted and are described. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1965
- Accession Number
- AD0615817
Entities
People
- Earl Feingold
- Willard H. Sutton
Organizations
- General Electric