PRODUCTION ENGINEERING MEASURE. TRANSISTOR, VHF, SILICON, POWER (25W-100MC).
Abstract
Improvements were made in the equipment and processes which prepare the transistors for capping. Evaluation of these improvements is now under way. Changes in the coldweld die have proven satisfactory and no other improvements are necessary. Evaluation of the split field microscope has been completed. The device has been assigned a JEDEC number (2N3674) and the package dimensions have been registered. Aluminum metallized units on operational life test showed electrical degradation. Preliminary samples of titanium-aluminum exhibited some improvement in life test performance. More samples are being evaluated. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 31, 1964
- Accession Number
- AD0615898
Entities
People
- G. R. Crabbs