THE FORMATION, BEHAVIOR, AND PROPERTIES OF STACKING FAULTS IN CRYSTALLINE MATERIALS,

Abstract

A review is given of the status of investigations at the end of the year, the primary approach still being X-ray techniques. The investigations included (1) determination of fault probability in the presence of applied or residual tensile stress for alpha brass in tension where the probability for a given strain is low (AD-602 114); (2) X-ray diffraction from niobium and tantalum deformed by wire drawing; (3) peak shifts caused by layer faults in Cr-1 Re and Cr-35 Re alloys; (4) X-ray diffraction from explosively deformed silicon bronze where line broadening appears to be caused by particle size not strain; (5) methods for calculation of electron diffraction patterns containing twin reflections; (6) elliptical diffraction patterns from faults in graphite; (7) possible standardization of crystallographic formulas for hexagonal lattices; and (8) extrinsic faults for cerium deformed (by filing) at room temperature as shown by peak shifts.

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1964
Accession Number
AD0615917

Entities

People

  • Henry M. Otte

Tags

DTIC Thesaurus Topics

  • Diffraction
  • Electron Diffraction
  • Graphitic Materials
  • Materials
  • Particle Size
  • Particles
  • Probability
  • Tensile Stress
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Materials science

Readers

  • Applied Combinatorial Optimization and Logic Circuit Design.
  • Materials Science (Mechanical Engineering).
  • Materials Science and Engineering.

Technology Areas

  • Microelectronics