ACCELERATED TESTING OF HIGH RELIABILITY PARTS.
Abstract
As a result of reliability testing of glass dielectric capacitors, data has been accumulated which offers an indication of an upper temperature limit for thermal acceleration of failures. The data which is still being gathered shows that an analytical expression for insulation resistance is extremely important in formalizing the stress response of the dielectric. Preliminary analysis of high stress data indicates that the oxide film resistor, the R-2008 P5 diode and the transistors have shown significant trends or failures; however, additional work is being performed in these areas to confirm the failure mechanisms. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1965
- Accession Number
- AD0617141
Entities
People
- G. Bretts
- Graeme Best
- H. Mclean
- H. S. Endicott
- T. M. Walsh
Organizations
- General Electric