STUDIES OF FIELD EMISSION AND ELECTRICAL BREAKDOWN BETWEEN MICRON-SIZED AREAS.
Abstract
In a modified 'Muller' microscope capable of controlled movements of one electrode to an accuracy of several hundred Angstrom units, a polished nickel surface has been scanned with a micron-sized positive electrode (collector) at distances of several microns. First results indicate that at certain localized sites the emission current passes through a maximum while moving the collector approximately parallel to the polished nickel surface. The current-voltage characteristics of this emission current satisfies the FowlerNordheim equation, thus indicating that field emission is involved. Some of the emitted electrons pass the rim of the collector and are accelerated towards a phosphor screen, where they produce a sickle-type emission pattern. In some cases several distinctly emitting sites could be observed from areas as small as 0.00002 sq cm. Further tests using this small-area collector method are planned in the near future. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1965
- Accession Number
- AD0617192
Entities
People
- Hans Hieslmair
Organizations
- United States Army Communications-Electronics Command