CHARACTERISTIC ENERGY LOSSES IN LAYERED METALLIC THIN FILMS.
Abstract
The characteristic electron energy loss spectra of layered films of Bi and Mg have been measured using a retarding potential electron energy analyzer with an electrically differentiated output to obtain the energy loss distribution directly. A new loss, that was not observed on single layer films of Mg or Bi, was found at 12.9 = 0.2 e.v. This loss can be interpreted as a surface plasma loss at the metal-metal interface. A surface loss in Al-Mg films was not reproducible, but a new loss was observed at 26.4 e.v. which can be interpreted as a single Al loss (15.4 ev) plus a single Mg loss (10.9 ev). Chemical and physical processes such as changes in composition and aggregation at the Al-Mg interface during both the preparation and measurement of the sample may alter the interface enough to decrease the intensity of the surface plasma loss. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 31, 1965
- Accession Number
- AD0617542
Entities
People
- N. N. Axelrod
Organizations
- University of Delaware