MICROELECTRONIC FREQUENCY AND TIME STANDARD.
Abstract
The frequency standard oscillator continued to be the major problem during this reporting period. The problems described in the last report with the CR-71/u crystals were solved the latter part of April and tests were begun on the prototype oscillator. All specifications were met except frequency stability over the environmental temperature range of 5 parts per 10 to the 10th power. This problem has been determined to be partly caused by incorrect thermistor location on the inner oven. This was corrected, but a change of 2 parts per 10 to the 9th power still existed. At the time of this report, it appears to be the result of voltage variations caused by a zener diode in the power supply which affects the frequency control varicap. A change to a more stable reference diode appears to have corrected this problem. The remaining portion of the equipment was delayed again due to receipt of the SCN's (semiconductor networks). These were received 27 May 1965. Due to these problems, the delivery of the system will probably be delayed to 1 September 1965. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 15, 1965
- Accession Number
- AD0617563
Entities
Organizations
- Texas Instruments