PHYSICS OF FAILURE IN ELECTRONICS. VOLUME III,

Abstract

The proceedings of the 1964 symposium on the physics of failure in electronics held at the Illinois Institute of Technology in Chicago are presented. Papers are presented on: Test, analysis, and correlation; Surface effects; Principles and applications; Effects in films; Bulk effects.

Document Details

• Document Type: Technical Report
• Publication Date: Jan 01, 1964
• Accession Number: AD0617715

Entities

People

• Joseph Vaccaro
• M. F. Goldberg

Organizations

• IIT Research Institute

Tags

DTIC Thesaurus Topics

• Continents
• Electronics
• Geographic Regions
• Illinois

Fields of Study

• Physics

Readers

• Academic Conference Management
• Theoretical Analysis.
• Thin Film Deposition Science.

Technology Areas

• Microelectronics