CAPACITANCE BETWEEN THIN-FILM CONDUCTORS DEPOSITED ON A HIGH-DIELECTRICCONSTANT SUBSTRATE.

Abstract

The capacitance between two thin-film conductors deposited on a high-dielectric-constant substrate is calculated by means of the Schwarz-Christoffel transformation. Numerical results are calculated and compared with experimental results. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1965
Accession Number
AD0618137

Entities

People

  • H. R. Kaiser
  • P. S. Castro

Organizations

  • Lockheed Martin Missiles and Space

Tags

DTIC Thesaurus Topics

  • Capacitance
  • Dielectric Permittivity
  • Electrical Properties
  • Electricity
  • Films
  • Substrates
  • Thin Films

Fields of Study

  • Materials science

Readers

  • Microwave Engineering.