BRUSHLESS PRECISION POTENTIOMETER.
Abstract
Conclusions: Two satisfactory methods of encapsulation which will prevent deterioration of the photoconductive element have been proven. The temperature coefficient of resistance was found to be an inverse function of the absolute value of input resistance. Analysis of data indicates that the temperature coefficient may be kept within specification for all absolute values of resistance by varying the width of the resistive element. Modification of evaporation masks is necessary to enable manufacture of elements within linearity requirements. Utilizing materials and processes established during the program, a prototype potentiometer was fabricated and preliminary evaluation provides confidence that with design refinement, the potentiometer is capable of meeting the design specification. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 22, 1965
- Accession Number
- AD0618913