ANALYSIS OF THE RESISTIVE LAYER TRANSDUCER,

Abstract

In a piezoelectric semiconductor, a surface layer of high resistivity material is driven by an alternating electric field, while the conducting substrate is mechanically coupled but not driven electrically. This analysis shows the response of the composite system, giving the behavior with frequency and effects due to loading. For reasonable (low) values of the attenuation constant, it is shown that the effect of the substrate is to lower the amplitude of vibration but leave the resonant frequency almost unchanged. An assumption, which limits the analysis, is that the proportionality constant between stress and rate of change of strain is independent of frequency. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 15, 1965
Accession Number
AD0619226

Entities

People

  • John L. Scales Iii.

Organizations

  • Harry Diamond Laboratories

Tags

DTIC Thesaurus Topics

  • Composite Materials
  • Dynamic Response
  • Electric Fields
  • Frequency
  • Materials
  • Piezoelectric Semiconductors
  • Resonant Frequency
  • Semiconductors
  • Substrates
  • Vibration

Readers

  • Educational Psychology
  • Microwave Engineering.
  • Structural Dynamics.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems