PRODUCTION ENGINEERING MEASURE (PEM) FOR SILICON VARACTOR DIODE.
Abstract
The present process is capable of evolving devices to the specified Group A parameters. Yield improvement must be made so that mean values of critical parameters fall well within specified limits in accordance with good reliability practice. Results of the 100 per cent screening cycle indicate that the devices can withstand mechanical and thermal stresses called out in the specification. Analysis of the screening failures indicate necessity for tighter controls over bonding and cleaning operations. Process inspection indicates a need for improved piece part plating. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 30, 1965
- Accession Number
- AD0619663
Entities
People
- Garrett D. Bowne
- Robert Bayliss
Organizations
- Sylvania Electric Products