FILTER CRYSTAL DEVELOPMENT PROGRAM (70 TO 150 MC).
Abstract
Data was gathered on plateback versus electrode thickness for 90 Mc, third overtone crystal units with 1.1 mm, 0.8 mm, and 0.6 mm diameter electrodes. This involved a method of measuring the unplated resonant frequency of the quartz blanks and the resonant frequency of a plated but unmounted blank. Subsequent measurements on plated mounted blanks have shown that measurement of the resonant frequency of plated blanks before mounting is necessary for good technique in the case of thin electrode plating or small values of plateback. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 16, 1965
- Accession Number
- AD0619710
Entities
People
- R. A. Auriemma