ELECTRICAL LEAKAGE IN THE SN1551B,

Abstract

Measurements were made on SN1551B oscillator tubes to determine the cause of electrical leakage in production tubes, to determine the effect of leakage on noise threshold voltage and noise generation during tube operation, and to determine whether the tube can be calibrated for use as its own ion gauge to measure its internal pressure. Tests showed, as postulated, that leakage was caused by deposition of a conducting film on the surfaces of insulators when the getter was flashed. Experimental evidence implicates electrical leakage as a factor in reductions in the noise threshold voltage and noise generated during oscillator operation. Although the experimental equipment was inadequate to complete measurements, the calibration of the tube as its own ion gauge appears possible and practicable. Further experimental work is recommended, to determine means of adequately confining getter flash during tube production and to complete calibration of the tube as its own ion gauge. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jul 15, 1965
Accession Number
AD0621174

Entities

People

  • Harold Edwin Boesch Jr.

Organizations

  • Harry Diamond Laboratories

Tags

DTIC Thesaurus Topics

  • Calibration
  • Communication Equipment
  • Demographic Cohorts
  • Dielectrics
  • Gages
  • Internal Pressure
  • Ionization Gages
  • Measurement
  • Measuring Instruments
  • Oscillators
  • Pressure Measurement
  • Production

Readers

  • Combustion Dynamics and Shock Wave Physics.
  • Electronics Engineering
  • Theoretical Analysis.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems