FIELD ION MICROSCOPE.

Abstract

Results of the experimentation are summarized by abstracts of papers given at the Field Emission Symposium, held at the Pennsylvania State Univ., Sept 7-11, 1965. The papers were: Field and temperature dependence of the image brightness in a field ion microscope (FIM), Gassurface interaction in the FIM, Precipitation in a Ni-Be alloy, Elastic deformation of emitter tips by the imaging field, Impurity interstitials in tantalum and in rhodium, and Laser pulse heating of emitter tips.

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1965
Accession Number
AD0621895

Entities

Organizations

  • Pennsylvania State University

Tags

DTIC Thesaurus Topics

  • Abstracts
  • Brightness
  • Electron Emission
  • Emission
  • Emitters
  • Field Emission
  • Impurities
  • Laser Pulses
  • Microscopes
  • Optical Phenomena
  • Optical Properties
  • Pennsylvania
  • Precipitation
  • Tantalum

Readers

  • Academic Conference Management
  • Materials Science and Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy