HIGH-TEMPERATURE THERMAL CONDUCTIVITY MEASUREMENTS IN SEMICONDUCTORS

Abstract

The objectives of the work are to measure the contact and bulk thermal conductivities of semiconductors at temperatures above room temperature by means of the series comparative method. To these has been added the measurement of thermal conductivity at temperatures below room temperature. Data is presented for indium antimonide and silicon.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1965
Accession Number
AD0622246

Entities

People

  • Robert G. Morris

Organizations

  • South Dakota School of Mines and Technology

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Antimonides
  • Conductivity
  • Electrical Conductivity
  • High Temperature
  • Indium
  • Indium Antimonides
  • Low Temperature
  • Magnetic Fields
  • Materials
  • Measurement
  • Radiation
  • Resistance Thermometers
  • Semiconductors
  • South Dakota
  • Standards
  • Temperature Gradients
  • Thermal Conductivity

Readers

  • Semiconductor Device Technology
  • Surface Engineering/Surface Coating Technology.

Technology Areas

  • Microelectronics