AIRFIELD MARKING PAINTS. I. EFFECT ON CRACKING OF SLURRY SEAL.

Abstract

A study is being conducted to determine the basic causes of early failure of airfield marking paints and the deterioration of underlying slurry seal and asphaltic pavement associated with these paints. In the present report, data and statistical analyses are presented on the initial cracking of slurry seal along the edges of stripes of 20 experimental paint formulations. Such cracking, which in some cases occurred as early as 2 weeks after application, was generally followed by edge lifting and then by loss of adhesion of slurry seal to the underlying asphaltic pavement. Stripes of paint containing chlorinated rubber cracked extremely rapidly, especially such stripes with a double thickness. Alkyd painted stripes generally had less cracking than oleoresinous painted stripes. Poorer performance of alkyd paints was associated with a solvent of high boiling range, and poorer performance of oleoresinous paints with solvents of low aromaticity. The addition of a slight amount of carbon black to the test paints raised the temperatures of stripes to only a very slight extent. This addition improved the performance of some test paints but lowered it for others. Stripes with greater flexibility generally had less edge cracking. There were numerous interactions between the above paint variables. Further causes of marking paint failure and the related damage to pavements and slurry seals are being investigated and will be reported later. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1965
Accession Number
AD0622555

Entities

People

  • Richard W. Drisko

Organizations

  • Naval Facilities Engineering Service Center

Tags

DTIC Thesaurus Topics

  • Adhesion
  • Data Science
  • Information Science
  • Landing Fields
  • Mathematics
  • Pavements
  • Physical Properties
  • Resilience
  • Statistical Analysis
  • Thickness

Readers

  • Materials Science and Engineering.
  • Pavement Materials Engineering.
  • Semiconductor Device Technology