A METHOD FOR DETERMINATION OF BROADENED X-RAY DIFFRACTION MAXIMA.

Abstract

An investigation was conducted to develop and evaluate an empirical method of determining the angular location of the K-alpha 1 peak of diffraction lines irrespective of the degree of resolution of the K-alpha 1 doublet. The empirical method is based upon the angular separation and intensity ratio between the two components of the K-alpha doublet. The presently used angular measures of diffraction maxima have precisions of measurement which are tolerable only when the K-alpha doublet is either well resolved or completely merged. The utility and precision of measurement are compared for the determination of lattice parameters, residual stresses, and microstresses by the empirical and customary methods, especially for completely merged doublets, to establish the general applicability of the empirical method. (Author)

Document Details

Document Type
Technical Report
Publication Date
Sep 17, 1965
Accession Number
AD0622558

Entities

People

  • R. Robert Erard

Tags

DTIC Thesaurus Topics

  • Diffraction
  • Intensity
  • Measurement
  • Precision
  • Residual Stress
  • Residuals
  • Stresses
  • Wave Phenomena
  • X Rays
  • X-Ray Diffraction

Readers

  • Analytical Mechanics
  • Materials Science and Engineering.
  • Systems Analysis and Design