CHEMICALLY DEPOSITED FERRITE FILMS AS NON-RECIPROCAL ELEMENTS IN AN EXPERIMENTAL RESONANCE ISOLATOR.
Abstract
Nickel, nickel zinc, and magnesium zinc ferrite thin films have been prepared singly and in combination utilizing chemical deposition techniques. These films, deposited on alumina substrates were then tested as nonreciprocal elements in an experimental resonance isolator in the 35 Gc frequency region. Device performance as well as the magnetic properties and crystallographic analysis is included. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1965
- Accession Number
- AD0622779
Entities
People
- Richard M. Stern
- Thomas Collins
- William J. Skudera Jr.
- William L. Wade Jr.
Organizations
- United States Army Communications-Electronics Command