EVALUATION OF SILICON METALLIC RECTIFIERS.
Abstract
Silicon rectifiers offer many advantages over rectifiers made of other materials, therefore, the use of these devices is widespread, particularly in military equipment applications. This project is designed to yield information to specify rectifier service life as a function of the ambient operating temperature for a medium-power class of diodes characterized by 1N540 diodes. To this end, three groups of rectifiers have been placed on life test at different ambient temperatures to determine three points on a curve of life versus ambient temperature. An accumulated test time of over 4,392 hours has been represented by data gathered on the 200C environmental group. To date, a total of 34 failures have occurred, and 11 diodes have survived the life test on this group. The 185C and 170C environmental groups were placed under life tests during the last period. At the end of 504 hours, 15 failures had occurred for the 185C test group and five failures for the 170C test group. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1960
- Accession Number
- AD0622928
Entities
People
- B. F. Lathan
Organizations
- IIT Research Institute