MEASUREMENT OF COMPLEX SHEAR MODULUS OF THIN VISCOELASTIC LAYERS.
Abstract
A method was developed for measuring the complex shear modulus of thin viscoelastic layers of adhesive using standard mechanical impedance equipment. The measurement is direct and the data can be quickly obtained once the environmental factors are fixed. It was found that the effective shear modulus of the adhesive as used in this test is much less than that of the material itself although the loss tangent is about the same. It was also found that transverse strain did not affect the true shear modulus, even for transverse extensions as large as 100%. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1965
- Accession Number
- AD0623059
Entities
People
- H. E. Miller
- J. L. Jurgens
- R. Plunkett
Organizations
- University of Minnesota