ANALYTICAL TECHNIQUES FOR THE DETERMINATION OF TRACE IMPURITIES IN CADMIUM SULFIDE.

Abstract

Analytical techniques were developed for the analysis of trace impurities in cadmium sulfide. The detection limit for most impurities is less than 10 parts per billion (atomic). Materials analyzed were in the form of fine powders, fragile needles and platelets, as well as bulk crystals of CdS, CdSe, ZnS, ZnSe, CdS:CdSe, CdS:ZnSe, Cd and Zn. The approaches used for obtaining accurate analytical results are applicable to most solid state materials. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1965
Accession Number
AD0623165

Entities

People

  • A. J. Socha
  • R. K. Willardson

Tags

DTIC Thesaurus Topics

  • Carbides
  • Chemical Compounds
  • Compound Semiconductors
  • Detection
  • Electronics
  • Impurities
  • Inorganic Carbon Compounds
  • Inorganic Chemicals
  • Materials
  • Semiconductors
  • Solid State Electronics

Readers

  • Calculus or Mathematical Analysis
  • Materials Science and Engineering.