SEMICONDUCTOR TRANSDUCERS FOR ULTRASONIC TESTING.
Abstract
A new type of ultrasonic transducer is discussed which employs a semiconductor crystal as the active element. Experiments are reported in which germanium and silicon crystals were used as transmitters and receivers of ultrasonic signals. The sensitivity of the semiconductor transducer is compared with piezoelectric transducers and ordinary capacitive probes employed under identical conditions. The semiconductor transducer is found to have a lower sensitivity than the piezoelectric transducer but it offers the advantages that it does not require a couplant and can be provided with a sharp point to permit testing on very rough surfaces. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1965
- Accession Number
- AD0623835
Entities
People
- Otto R. Gericke
Organizations
- United States Army Research Laboratory