STUDY OF OPTICAL AND TRANSPORT PROPERTIES OF THIN FILMS OF METALS AND ALLOYS.

Abstract

The results of the following investigations are presented: (1) Improvements to the preparation and fabrication of evaporated thin metallic films; (2) Comparison of thin film thickness using x-rays, the temperature coefficient of the resistivity and goniophotometric measurements; (3) Use of goniophotometric measurements for detecting very thin surface layers (oxides); (4) Use of ellipsometric measurements for study of thin films and surfaces, with new instrumentation; (5) Measurement of resistivity and Hall constant of thin metal films in vacuo with high accuracy; (6) Use of the optical and electrical measurements performed on the same film in order to determine the scattering parameter and the optical effective mass of the conduction electrons, and the resistivity due to defects in the film; and (7) New results concerning the optical properties of Au, Cu, Pd, and Au-Pd. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jul 09, 1965
Accession Number
AD0624101

Entities

People

  • F. Abeles

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Accuracy
  • Coefficients
  • Electrical Measurement
  • Films
  • Instrumentation
  • Measurement
  • Measuring Instruments
  • Metal Films
  • Optical Properties
  • Scattering
  • Temperature Coefficients
  • Thin Films
  • Transport Properties
  • X Rays

Fields of Study

  • Physics

Readers

  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene