RADIATION EFFECTS ON MICROELECTRONIC CIRCUITS (SEMICONDUCTOR).

Abstract

The first quarter of the program was devoted entirely to the preparation of devices and instrumentation for the radiation tests. The circuits were procured and subjected to a thorough pre-irradiation test in the laboratory. The report describes the circuits chosen for study and the measurements made in the laboratory bench tests. All of the instrumentation to be used in this program is described in detail in this report. This includes the instrumentation for (1) the laboratory bench tests, (2) the Linac transient radiation effects tests, and (3) the pulsed reactor permanent damage tests. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1965
Accession Number
AD0624561

Entities

People

  • A. M. Liebschutz
  • C. W. Perkins
  • E. P. Mitchell
  • R. W. Marshall

Organizations

  • Hughes Aircraft Company

Tags

DTIC Thesaurus Topics

  • Bench Tests
  • Buildings And Structures
  • Compound Semiconductors
  • Determinants (Mathematics)
  • Electronics
  • Instrumentation
  • Measurement
  • Radiation
  • Radiation Effects
  • Research Facilities
  • Semiconductors
  • Solid State Electronics

Fields of Study

  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Software Engineering

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems