RADC RELIABILITY PHYSICS NOTEBOOK
Abstract
The results of physical and chemical investigations on basic mechanisms and processes in materials which cause or contribute to degradation, aging, and failure of electronic devices are summarized. Data is presented, in practical form wherever possible, for use by design and test engineers concerned with the assessment, prediction, and improvement of the reliability of solid state electronic devices. Techniques and procedures for obtaining data on specific part types and for applying such data to accelerated testing, screening, and reliability prediction programs are discussed. Format of the report is designed to facilitate periodic revision and inclusion of results of future investigations in basic failure mechanisms in electronic materials.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1965
- Accession Number
- AD0624769
Entities
People
- A. B. Timberlake
- B. J. Nicholson
- C. W. Hamilton
- H. C. Gorton
- H. W. Ray
- Joseph Vaccaro
- T. S. Shilliday
Organizations
- Battelle Memorial Institute