MICROELECTRONIC AMPLIFIERS HAVING MINIMUM SENSITIVITY TO ARBITRARY PARAMETER CHANGES,

Abstract

The ease and low cost of fabricating large numbers of transistors in microelectronic configurations make feasible the use of redundant active devices to achieve improved reliability and decreased sensitivity to parameter changes. This paper considers an amplifier configuration which has particular advantages for microcircuit realization. The arrangement described is capable of yielding a fractional gain change which is equal to the product of the fractional deviations in the gains of each of the redundant signal channels. The nominal inputoutput transmission is maintained, with negligible changes in gain and bandwidth, even with complete failure of one or more (but not all) of the signal channels; this is achieved at the expense of an increase in sensitivity. The sensitivity to large parameter changes can be minimized over an appreciable portion of the amplifier passband by use of the systematic design procedure which is presented. Experimental verification of theoretical predictions and the design procedure is included. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1965
Accession Number
AD0625379

Entities

People

  • James H. Mulligan Jr.
  • John J. Golembeski
  • Mohammed S. Ghausi
  • Sidney S. Shamis

Organizations

  • New York University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Amplifiers
  • Bandwidth
  • Electronic Amplifier
  • Electronic Equipment
  • Electronics
  • Microcircuits
  • Reliability
  • Semiconductor Devices
  • Sensitivity
  • Solid State Electronics
  • Transistor Amplifiers
  • Transistors
  • Verification

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Radio communications and signal processing.
  • Regression Analysis.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems