MEASUREMENT TECHNIQUES FOR OVERSIZED WAVEGUIDE.

Abstract

The first phase of this work is concerned with the identification as well as estimating the power coupling of spurious modes in the presence of TE10, the main mode in the overmoded waveguide. The second phase would consider the measurement of known or approximately known discontinuities such as dielectric slabs and capacitive irises or steps. Precision experimental procedure carried out enables the measurement of spurious modes coupled more than 25 db below the main mode. The dielectric constant evaluated from the experimental results was surprisingly close to the previously measured and specified value. The device under study is a 6 inch square overmoded waveguide fed by a sequence of long rectangular tapers from standard S, C and X band waveguides. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 18, 1965
Accession Number
AD0625452

Entities

People

  • B. L. Gupta

Organizations

  • New York University Tandon School of Engineering

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Couplings
  • Dielectric Permittivity
  • Discontinuities
  • Identification
  • Measurement
  • Precision
  • Sequences
  • Standards
  • Waveguides
  • X Band

Fields of Study

  • Physics

Readers

  • Microwave Engineering.
  • Regression Analysis.