INVESTIGATION OF FAULT DIAGNOSIS BY TRANSFER FUNCTION TECHNIQUES.
Abstract
The program under this contract was directed toward demonstrating the feasibility of fault diagnosis by transfer function techniques for linear electronic circuits. The objective was to be able to diagnose faults to the component level using only available input and output terminals and a minimum number of internal test points. The methodology was to formulate and implement the theories, techniques and computer program required to generate a test procedure to diagnose a general class of linear electronic circuits. The technique investigated is that of observing changes in the breakpoint frequencies and amplitudes of the normal frequency response curves of the circuit under test and relating these changes to the faulty elements so that they may be diagnosed. The validity of this technique is based upon the fact that the breakpoint information together with the gain at any frequency serves to uniquely identify the transfer function of the system. The application of topological formulas to the generation of the symbolic transfer function of the circuit under test, and numerical evaluation of the generated function under normal and simulated failure conditions is the specific technique employed. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 1965
- Accession Number
- AD0625587
Entities
People
- John H. Maenpaa
- Thomas K. Mcbride
- Walter J. Stahl