RELIABILITY ANALYSIS OF X-BAND TUNNEL DIODES.
Abstract
The report presents an account of a microwave tunnel diode improvement program, and the results obtained from reliability tests performed on devices fabricated by the improved processes. A new solid structure tunnel diode was developed during this contract which exhibits superior reliability characteristics to any previously tested tunnel diode. The process and fabrication details for this device along with reliability data are included in the report. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1965
- Accession Number
- AD0625956
Entities
People
- Arthur Lueck
- Charles Davis
Organizations
- Sylvania Electric Products