RESEARCH ON II-VI COMPOUND SEMICONDUCTORS.

Abstract

Epitaxial growth of CdS and CdSe from the vapor phase was examined by direct visual observations. The relative ease with which large crystals were produced indicates that this should soon become the preferred method of growth. Radioisotopic studies, carried out in newly designed miniature growth furnaces, show that In114 accumulates in the supply which leads to concentration gradients in the sublimed crystals. Crystal color and lowtemperature fluorescence are correlated with In114 concentration. New measurements on injection luminescence from forward biased CdS cells at 77K yield: source brightness approximately 0.01 watts/sq cm, power efficiency = 10 to the minus 8th power to 0.00001 rising rapidly with voltage, rise time <0.2 microsec, decay time approximately/micro sec and polarization E perpendicular to C > 90%. Refractive index measurements (band edge to 1.5 micros yield long-wavelength optical dielectric constants of 7.26 = 0.03 for ZnTe and 5.96 = 0.02 (E perpendicular to C) and 6.05 = 0.02 (E parallel to C) for CdSe. Electro-optic coeffieients (r sub 13 -r sub 33) and r sub 51 for CdS were determined as 4x10 to the minus 12th power and 3.7 x 10 to the minus 12th power m/V, respectively. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 08, 1963
Accession Number
AD0626536

Entities

People

  • G. P. Chotkevys
  • J. L. Barrett
  • J. M. Jost
  • L. R. Shiozawa
  • S. S. Devlin

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Crystals
  • Dielectric Permittivity
  • Epitaxial Growth
  • Fluorescence
  • Long Wavelengths
  • Luminescence
  • Measurement
  • Optical Phenomena
  • Optical Properties
  • Refractive Index
  • Semiconductors
  • Silicon Carbide
  • Vapor Phases

Readers

  • Materials Science and Engineering.
  • Mathematics or Statistics
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics