STUDY, INVESTIGATION, AND DEVELOPMENT OF NON-DESTRUCTIVE RELIABILITY SCREENING OF METALLIZED MYLAR CAPACITORS.

Abstract

The scope of work being performed is reviewed, and the self-healing mechanism unique to metallized Mylar capacitors is described. The principal failure modes of these capacitors are listed. The procedures used to determine the proper measurement conditions for nondestructive screening are presented. The techniques used to analyze the results of these investigations are outlined. The measurement conditions which showed the largest dispersions of results are: for insulation resistance - 300 VDC at 65C; for dissipation factor 30 VAC, 100 cps, at 85C. An additional experiment selected conditions of 250 VAC, 60 cps, at 25C for the test. The details of this experiment are described. The program for the clearing test is detailed, and the life test conditions for the cleared units are given. One portion of the clearing test remains to be accomplished. The program for the burn-in test is outlined, and the test matrix is presented. The results of life testing the burned-in units are being analyzed. (Author)

Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1965
Accession Number
AD0626992

Entities

People

  • E. Rondeau

Organizations

  • Sprague Electric

Tags

DTIC Thesaurus Topics

  • Capacitors
  • Dispersions
  • Dissipation
  • Dissipation Factor
  • Failure Mode And Effect Analysis
  • Insulation
  • Life Tests
  • Measurement
  • Reliability
  • Resistance

Fields of Study

  • Engineering

Readers

  • Electrical Engineering
  • Reinforced Composite Materials
  • Software Engineering

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems