QUANTITATIVE TEXTURE MEASUREMENTS ON EVAPORATED FILMS,

Abstract

A method is described for determining pole figures from thin films which are still attached to their substrates. The usual correction formulas take into account absorption and change in diffracting volume as the thin film rotates in the X-ray beam. Additional correction formulas are derived which take into account the X-ray scattering from and attenuation in the substrate. The technique is demonstrated for a highly oriented 885 A gold film deposited on a thin optical glass substrate. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 29, 1965
Accession Number
AD0627342

Entities

People

  • Fred Witt
  • Milton E. Schwartz
  • Richard W. Vook

Tags

DTIC Thesaurus Topics

  • Absorption
  • Attenuation
  • Cooperation
  • Films
  • Glass
  • Measurement
  • Optical Glass
  • Scattering
  • Substrates
  • Thin Films
  • X Ray Scattering
  • X Rays

Fields of Study

  • Physics

Readers

  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Materials Science and Engineering.