DOSE RATE AND SPECTRAL MEASUREMENTS FROM PULSED X-RAY GENERATORS
Abstract
Typical X-ray spectra from high intensity pulsed X-ray sources were determined by means of an equivalent constant voltage accelerator. The photon energy spectrum for the forward X-ray beam was measured with various X-ray target thicknesses at accelerator voltages of 1.0, 1.5 and 2.0 Mv. X-ray spectra were also obtained from a reflection X-ray target an angles of 7 deg and 45 deg with respect to the X-ray beam at applied potentials of 0.55, 1.0 and 2.0 Mv. The dose rate dependence of thermo luminescent LiF, silver-activated phosphate glass, and dosimetry film was investigated over a range of dose rates extending from 10,000 to 10 to the 11th power rad/sec with three separate flash X-ray systems.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 03, 1965
- Accession Number
- AD0627567
Entities
People
- Eugene Tochilin
- Norman Goldstein
Organizations
- Naval Radiological Defense Laboratory