A VACUUM PATH X-RAY DIFFRACTOMETER FOR PRECISION RELATIVE LATTICE PARAMETER MEASUREMENTS ON SINGLE CRYSTALS

Abstract

A vacuum path X-ray diffractometer designed for lattice parameter measurements on single crystals is described. It is an instrument of high precision approaching 1 part in 1,000,000 or better, and is also capable of moderately high accuracy of approximately 1 part in 100,000. The instrument is conceptually a variation of an earlier design but various factors are introduced to facilitate convenient experimental conditions. Scanning is automatic and provision is made on the instrument for a large working volume to accommodate auxiliary environmental equipment for the specimen. The mounting and measurement procedure is described and a sample calculation of lattice parameter with associated accuracy and precision is given. A discussion of the errors encountered in high precision measurements of this type concludes the report.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1966
Accession Number
AD0627848

Entities

People

  • K. Kramer
  • R. Dyer
  • R. Feder

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Abstracts
  • Accuracy
  • Automatic
  • Crystal Lattices
  • Crystallography
  • Crystals
  • Diffraction
  • Diffractometers
  • High Temperature
  • Measurement
  • Potassium Chloride
  • Refraction
  • Scanning
  • Single Crystals
  • Standards
  • X Ray Tubes
  • X Rays

Fields of Study

  • Physics

Readers

  • Geodesy
  • Materials Science and Engineering.
  • Systems Analysis and Design