MICROMODULE LIFE TEST PROGRAM.
Abstract
A total of 2682 micromodules remained on life test at the beginning of this quarter and eight failures occurred during this period. The number of failures, accumulated operating time, and best estimate mean-time-to-failure (MTTF) for life testing to date are presented in tabular form. Included in the number of failures for the XM-1364 modules are 33 failures that were caused by inserting the module in the test socket or the life test board in the wrong position. This will provide the wrong voltages to be applied to the module riser wires causing permanent module damage. It is planned to continue testing in subsequent periods until surviving micromodules have each accumulated 10,000 hours of operation. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 17, 1965
- Accession Number
- AD0628012
Entities
People
- F. E. Farmar