ATOMIC DISPLACEMENTS IN ONE- AND TWODIMENSIONAL DIFFUSION,
Abstract
The statistics of surface diffusion phenomena are developed for the conditions appropriate to measurements in the ion microscope. Examined in detail are: (1) the effect of boundaries (lattice steps) on the mean square displacement in a random walk; (2) the probability density for distances traversed in a two-dimensional walk along nonorthogonal surface channels; and (3) the distribution of distances for random walks in which the number of jumps is subject to fluctuation, as it is in real systems. Both reflecting and adsorbing boundaries are found to diminish the mean square displacement in the same fashion. The effect of nonorthogonality, and even more so of fluctuations, is to enhance the frequency of small displacements when compared with a Rayleigh distribution. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1965
- Accession Number
- AD0628016
Entities
People
- Gert Ehrlich
Organizations
- General Electric