CALCULATIONS CONCERNING ELECTRICAL BREAKDOWN INDUCED BY THE MELTING OF MICROSCOPIC PROJECTIONS,

Abstract

Calculations have been made concerning electrical breakdown induced by the melting of microscopic projections on the cathode surface. A digital computer analysis of tungsten shown a surprising correlation between measured electrical breakdown fields and the fields necessary to melt tungsten projections. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1966
Accession Number
AD0628114

Entities

People

  • Donald A. Lee

Organizations

  • University of Illinois Urbana–Champaign

Tags

DTIC Thesaurus Topics

  • Computers
  • Computing Devices
  • Digital Computers
  • Elements
  • Group 6 Elements
  • Tungsten

Fields of Study

  • Physics

Readers

  • Combustion science or combustion engineering.
  • Human-Computer Interaction (HCI).
  • Semiconductor Device Technology